Call for papers--Conference on surface metrology and art conservation

Call for papers
Second international conference on surface metrology
October 2010

The Surface Metrology Lab at Worcester Polytechnic Institute in
Worcester, Massachusetts, USA, is organizing the second
International Conference on Surface Metrology (25-27 October 2010)
to exchange information on applications and common interests in the
measurement and analysis of surface topographies in diverse fields
ranging from nanotechnology and metallurgy to biotechnology and
cultural heritage.

This call for papers on Surface Metrology Applied to Art
Conservation and Cultural Heritage will be dedicated to the nature
and characterization of the surfaces of works of art, historic
objects, art conservation and cultural heritage. It is being
organized by Christopher A. Brown, Worcester Polytechnic Institute,
and Patrick Ravines, George Eastman House International Museum of
Photography and Film.

We encourage you to consider submitting an abstract for oral or
poster presentation on research related to the measurement,
characterization and nature of the surface geometry and topography
of cultural heritage, historic and artistic works and their
conservation.

For details on the International Conference on Surface Metrology
please refer to

    <URL:http://www.surfacemetrology.org/>

Patrick Ravines
Senior Research Fellow and Project Conservator
George Eastman House International Museum of Photography and Film
900 East Avenue
Rochester, New York
USA 14607
585-271-3361 ext 318


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                  Conservation DistList Instance 23:36
                  Distributed: Monday, March 22, 2010
                       Message Id: cdl-23-36-009
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