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Subject: Symposium on non-invasive analysis of painted surfaces

Symposium on non-invasive analysis of painted surfaces

From: Christopher L. Wayner <waynercl<-at->
Date: Thursday, December 19, 2013
"The Non-Invasive Analysis of Painted Surfaces"
Washington, DC
20-21 Feb, 2014

On February 20-21, 2014, the Smithsonian American Art Museum in
Washington, DC will host a two-day international symposium will
focus on recent advances in technology and instrumentation for the
analysis of painted surfaces.

While non-destructive and micro-destructive analytical methods are
often essential for the study and understanding of paintings, recent
developments in portable and non-invasive instrumentation have led
to growing interest in the applicability of techniques to the study
of paintings.  Further, as new instrumentation becomes commercially
available and more affordable, conservators and scientists are able
to use non-invasive techniques for monitoring and analysis in new

A particular focus of the conference will be the interpretation of
analytical results from portable instrumentation including
colorimetry, imaging and X-ray fluorescence spectroscopy.  The
format of the conference will include papers and panel discussions.

Registration for this conference is required.  For registration and
additional information, please visit the education tab of the
American Institute for Conservation's website:


This conference is presented in partnership with the Lunder
Conservation Center, ICOM-CC Paintings Working Group, ICOM-CC
Scientific Research Working Group, and FAIC.

Christopher Wayner
Program Coordinator
Lunder Conservation Center
Smithsonian American Art Museum

                  Conservation DistList Instance 27:27
                Distributed: Saturday, December 21, 2013
                       Message Id: cdl-27-27-007
Received on Thursday, 19 December, 2013

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