Conference on surface metrology and art conservation

International conference on surface metrology applied to cultural
heritage and art conservation

The Surface Metrology Lab at Worcester Polytechnic Institute in
Worcester, Massachusetts, USA, is organizing an International
Conference on Surface Metrology to discuss and exchange information
on diverse applications and common interests in the measurement and
analysis of surface topographies. This rapidly advancing field has a
myriad of applications in diverse fields ranging from metallurgy to
biotechnology to cultural heritage.

A special session on Surface Metrology Applied to Cultural Heritage
and Art Conservation is being organized by Christopher A. Brown,
Worcester Polytechnic Institute, and Patrick Ravines, George Eastman
House International Museum of Photography and Film.  This is the
first time that a session is being dedicated to the nature and
characterization of the surfaces of works of art, historic objects
and cultural heritage.

This note is to encourage you to consider attending the conference
and there is still time for submitting a poster abstract on research
related to the measurement, characterization and nature of the
surface geometry and topography of cultural heritage, historic and
artistic works and their conservation.  We look forward to seeing
you and/or receiving your abstracts for posters in late October
2009.

For details on the International Conference on Surface Metrology
please refer to <URL:http://www.surfacemetrology.org/>

For information on the Surface Metrology Lab at Worcester
Polytechnic Institute see:

<URL:http://www.me.wpi.edu/research/SurfMet/>

Patrick Ravines
Senior Research Fellow and Project Conservator
George Eastman House International Museum of Photography and Film
900 East Avenue
Rochester, New York
USA 14607
585-271-3361 ext 318


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                  Conservation DistList Instance 23:11
                Distributed: Wednesday, October 7, 2009
                       Message Id: cdl-23-11-013
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