Courses on microscopy

The College of Microscopy is pleased to announce the following
courses for the remainder of 2009 of interest to the conservation
professional. Through generous support of FAIC/AIC many of our
courses provide financial assistance to AIC members. See

    <URL:http://www.collegeofmicroscopy.com/courses/>

Sep 11, 2009
COM801: Laboratory Safety

    The course is designed to give a brief introduction to the
    potential hazards and risk involved in working in a laboratory,
    handling chemicals, and operating equipment, including how to
    prevent laboratory accidents, how to minimize exposure to
    potential hazards and how to safely dispose of materials. The
    course gives a brief overview of employee and employer
    responsibilities including documentation, personal protective
    equipment, and training.  Due to the expansive nature of this
    topic, the course is not designed to encompass every facet of
    laboratory safety or replace any OSHA approved courses, but
    rather is intended to serve as a condensed introduction and
    hands-on application to laboratory safety for the non-scientist.

Sep 14-18, 2009
COM420: Microscopical Identification of Pigments for Conservators

    The College of Microscopy is pleased to offer a Special
    Applications course in paint materials identification for
    conservation professionals in paintings and architecture. The
    focus of this course is the identification of pigments using
    polarized-light microscopy (PLM). A practical introduction to
    PLM methods is taught using many examples from the world of
    pigments. A more thorough treatment of PLM theory and principles
    is covered in the Polarized-Light Microscopy course.

    This course also introduces students to other analytical methods
    used as confirmatory methods; these include microchemical
    methods, elemental characterization using XRF or SEM/EDS, Raman,
    and infrared spectroscopy. The students examine and sample
    paintings and architectural artifacts, prepare specimens for
    analysis, perform PLM analysis, and direct or perform further
    confirmatory analyses. Methods for characterization of binding
    media and support canvas materials are also discussed.

Sep 21-25, 2009
COM800: Chemistry for Conservators

    The College of Microscopy is pleased to offer a course in
    chemistry specifically for the conservation professional. The
    course is designed as a week-long intensive chemistry review for
    conservation professionals who would like to refresh their
    knowledge of chemical concepts, language, and applications or as
    an introduction to Chemistry for those individuals interested in
    pursuing a career in conservation. This course will introduce
    the student to theory and concepts basic to understanding
    chemical problems. These basics will be used as a foundation to
    build on chemical topics of particular interest to the
    conservation professional.

Oct 1-2, 2009
COM311: Sample Preparation: Polymers, Paints, and Coatings

    Taught by McCrone Associates' Cleanroom staff, specialized
    techniques are demonstrated for isolating and mounting
    contaminants from real-world samples of polymers, paints and
    coatings. Students use an Olympus SZX10 stereomicroscope and
    specialized microtools. More than 50% of class time is spent
    practicing the techniques. This 2-day practical course is
    customized to meet the needs of each individual student. A
    maximum class size of 10 students allows the instructor(s) to
    provide individual attention. Prior to the course, each enrolled
    student is asked to fill out a questionnaire to ensure their
    individual needs are met. Students are also encouraged to bring
    samples with them to the class. In addition to using actual
    samples in the course, each student has access to the new online
    McCrone Atlas of Microscopic Particles. The Atlas contains PLM
    and SEM images, descriptions, and EDS, IR, and Raman spectra
    from over 100 fully-characterized microscopic materials.

Oct 5-9, 2009
COM200: Scanning Electron Microscopy

    The College of Microscopy Scanning Electron Microscopy (SEM)
    course emphasizes hands-on learning. Using five SEM and EMA
    instruments, students have the opportunity to study their own
    samples, or test samples provided by our staff, under the
    direction of McCrone scientists with over 40 years of combined
    SEM/EDS/WDS experience. During the course, students learn
    through lecture, demonstration, and hands-on participation how
    to setup and operate SEM and EDS instruments, including
    low-vacuum and field-emission models. The final quarter of the
    course is devoted to student projects, where students are
    invited to analyze their own samples on a variety of SEM
    instruments: JEOL JSM-6460LV low vacuum SEM, JEOL JSM-6480LV low
    vacuum SEM, JEOL JSM-6301F field emission SEM, JEOL JXA-8900
    combined EDS/WDS electron microprobe analyzer, and JEOL JXA-8200
    combined EDS/WDS electron microprobe analyzer. This course
    provides a foundation for students new to SEM and EDS. At the
    end of the course, students with no prior experience are able to
    align an SEM, obtain secondary electron (SE) and backscatter
    electron (BE) micrographs, and perform EDS qualitative and
    quantitative analysis. For students with prior experience, we
    emphasize procedures to better utilize SEM and EDS to solve
    practical problems. The experience of our instructors allows
    them to offer insight on optimizing SEM and EDS analysis for a
    wide range of materials analysis questions.

Oct 12-14, 2009
COM300: Microscopic Particle Handling: Particle Isolation,
    Manipulation, and Mounting

    This College of Microscopy course focuses on isolating,
    mounting, and handling 1-100um sized particles without the use
    of micromanipulators. Methods for isolating contaminants from
    liquids, solids or on surfaces are covered. Preparation methods
    for further analysis by PLM, IR, Raman, SEM and TEM are
    demonstrated and discussed. Students spend more than 50% of
    class time practicing these techniques under the supervision of
    the instructor. Some of the sample-handling supplies made in
    class are retained by the students for their own use. Each
    student will be supplied with a detailed laboratory manual for
    reference and work hands-on with an Olympus SZX10
    stereomicroscope for use during class exercises. Olympus BX51
    polarized light microscopes are also available for student use
    during the course.

Nov 17-29, 2009
COM600: Infrared Microscopy

The College of Microscopy course in Infrared Microscopy is designed
to provide practical instruction in "real world" use of the FTIR
microscope. The class utilizes demonstrations and laboratory
exercises supplemented with lectures. Students are strongly
encouraged to bring their own samples for analysis. Class size is
limited to eight students to allow for maximum student
participation. Four experienced McCrone analysts teach the class,
and tailor the laboratory exercises and discussions to the skill
level and interests of the students. This course assumes basic
knowledge of infrared spectroscopy and operation of an FTIR
microscope. There is a brief discussion of infrared theory, and a
heavy emphasis on using FTIR microscopy in problem-solving
applications. The emphasis is on student sample preparation
exercises and the use of different spectral acquisition methods to
obtain optimum results.

Course registration can be completed online by visiting the Course
Catalogue and choosing a course of interest. For additional
information or offline registration for courses offered by the
College of Microscopy, please contact:

    Lois Gelwicks
    Registrar
    College of Microscopy
    850 Pasquinelli Drive
    Westmont, IL 60559-5539
    630-887-7100
    Fax: 630-887-7412
    education<-at->collegeofmicroscopy<.>com
    <URL:http://www.collegeofmicroscopy.com>


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                  Conservation DistList Instance 23:5
                  Distributed: Thursday, June 11, 2009
                        Message Id: cdl-23-5-014
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