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Subject: Conference on microanalysis of particles

Conference on microanalysis of particles

From: Joseph R. Swider <jswider<-at->
Date: Monday, February 9, 2009
Microbeam Analysis Society
Microanalysis of Particles
2009 Topical Conference
Westmont, Illinois
April 21-23, 2009

This conference takes a pragmatic approach to a subtle subject--the
microanalysis of particles.  Techniques covered include EDS, WDS,
AEM, SIMS, XRD, synchrotron XRF.  We have invited some of the most
well known names in the industry to present extended talks in the
morning. In  the afternoon, attendees will be able to select among
various hands-on modules.  Both novices and experienced analysts
will benefit.

Sample of Confirmed Invited Speakers:

    Bob Anderhalt
    Improved quantitative analysis of particles with topography
    using multiple EDS detectors

    John Armstrong
    Carnegie Institution for Science
    ZAF corrections for particle analysis

    Paul Carpenter
    Washington University of St. Louis
    Electron-probe microanalysis of particles and heterogeneous

    John Fournelle
    University of Wisconsin - Madison
    Evaluating atmospheric particles with combination of EDS, WDS
    and EBSD techniques

    Nicholas Ritchie
    Using DTSA-II to simulate and interpret energy dispersive
    spectra from particles

    Volker Rose
    Argonne National Laboratory
    New ways to see a smaller world: The Hard X-ray Nanoprobe at
    Argonne National Laboratory

    Elaine Schumacher
    McCrone Associates, Inc.
    Transmission electron microscopy for high resolution
    single-particle analysis

    Craig Schwandt
    McCrone Associates, Inc.
    Microanalysis of particles: An overview

    Joseph Swider
    McCrone Associates, Inc.
    Powder micro X-ray diffraction of particles

    Ed Vicenzi
    Smithsonian Institution
    Microanalysis of inclusions

    Robert Winarski
    Argonne National Laboratory
    The X-ray nanoprobe

    Nestor Zaluzec
    Argonne National Laboratory
    Characterization of nanoscale particles in the analytical
    electron microscope: Past, present and future

For additional details:


To sign up:


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                  Conservation DistList Instance 22:46
                 Distributed: Friday, February 13, 2009
                       Message Id: cdl-22-46-016
Received on Monday, 9 February, 2009

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